Scanning Probe Microscopy And Spectroscopy. Theory, Techniques, And Applications, Second Edition

Over the past two decades, scanning probe microscopies and strectroscopies have gained acceptance as indispensable characterisation tolls for an array of disciplines. This book provides novices and experienced researches with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunnelling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialities at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in material science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also unparalleled reference text for advanced undergraduates and graduate students in those fields.