Spectroscopy In Catalysis. An Introduction, Second Edition

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J-W Niemantsverdriet - Spectroscopy In Catalysis. An Introduction, Second Edition.
" Spectroscopy in Catalysis" describes the most important modern analytical techniques used to investigate catalytic surfaces. These techniques include... Lire la suite
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Résumé

" Spectroscopy in Catalysis" describes the most important modern analytical techniques used to investigate catalytic surfaces. These techniques include electron spectroscopy (XPS, UPS, AES, EELS), ion spectroscopy (SIMS, SNMS, RBS, LEIS), vibrational spectroscopy (infrared, Raman, EELS, sum frequency generation), temperature-programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXFAS), and microscopy (TEM, SEM, STEM, STM, PEEM, AFM, FEM, and FIM). Each chapter provides current applications to illustrate the type of information that the technique provides and evaluates its possibilities and limitations. A concise Appendix describes the most relevant aspects of the theory of surfaces and of chemisorption. The Second Edition includes significant new developments, e*g*, the scanning probe microscopies, imaging and vibrational techniques have been revised, case studies expanded with an example on polymerization catalysts, and all the other chapters updated with recent examples and relevant new literature. From reviews of the First Edition : "This is a truly valuable book... very useful for industrial practitioners who need to bc aware of the type of information that can bc obtained from modern surface spectroscopies... it has a superb pedagogic value..." Journal of Catalysis. " This is an excellent text on spectroscopies in catalysis and I highly recommend it for... introductory courses on heterogeneous catalysis or as a general introductory monograph." Journal of the American Chemical Society.

Sommaire

    • Heterogeneous Catalysis
    • Aim of Catalyst Characterization
    • Spectroscopic Techniques
    • Research Strategies
    • References
  • TEMPERATURE PROGRAMMED TECHNIQUES
    • Temperature Programmed Reduction
    • Temperature Programmed Sulfidation
    • Temperature Programmed Reaction Spectroscopy
    • Thermal Desorption Spectroscopy
    • Temperature Programmed Reaction Spectroscopy in UHV
    • References
  • PHOTOEMISSION AND AUGER SPECTROSCOPY
    • X-Ray Photoelectron Spectroscopy (XPS)
    • Ultraviolet Photoelectron Spectroscopy (UPS)
    • Auger Electron Spectroscopy
    • References
  • THE ION SPECTROSCOPIES
    • Secondary Ion Mass Spectrometry (SIMS)
    • Secondary Neutral Mass Spectrometry (SNMS)
    • Ion Scattering : The Collision Process
    • Rutherford Backscattering Spectrometry (RBS)
    • Low Energy Ion Scattering (LES)
    • References MÔSSBAUER SPECTROSCOPY
    • The Mössbauer Effect
    • Mössbauer Spectroscopy
    • Mössbauer Spectroscopy in Catalyst Characterization
  • DIFFRACTION AND EXAFS
    • X-Ray Diffraction
    • Low Energy Electron Diffraction
    • Extended X-Ray Absorption Fine Structure (EXAFS)
  • MICROSCOPY AND IMAGING
    • Electron Microscopy
    • Field Emission and Ion Microscopy
    • Scanning Probe Microscopy : AFM and STM
    • Other Imaging Techniques
  • THE VIBRATIONAL SPECTROSCOPIES
    • Theory of Molecular Vibrations
    • Infrared Spectroscopy
    • Sum Frequency Generation
    • Raman Spectroscopy
    • Electron Energy Loss Spectroscopy (EELS)
    • Concluding Remarks
  • CASE STUDIES IN CATALYST CHARACTERIZATION
    • Supported Rhodium Catalysts
    • Alkali Promoters on Metal Surfaces
    • Cobalt-Molybdenum Sulfide Hydrodesulfurization Catalysts
    • Chromium Polymerization Catalysts
    • Concluding Remarks.

Caractéristiques

  • Date de parution
    01/08/2000
  • Editeur
  • ISBN
    3-527-30200-X
  • EAN
    9783527302000
  • Présentation
    Relié
  • Nb. de pages
    320 pages
  • Poids
    0.77 Kg
  • Dimensions
    17,5 cm × 24,5 cm × 2,2 cm

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