DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN
Miron Abramovici, AT&T Bell Laboratories; Melvin A. Breuer, University of Southem California, Los Angeles; and Arthur D. Friedman, George Washington University
The revised printing of this widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.
Considered a definitive text in this area, the book includes in-depth discussions of the following topics:
Fault modeling for classic and new technologies
Design for testability
All topics are covered extensively, from fundamental concepts to advanced techniques.
Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.