An Introduction To Surfaces Analysis By Xps And Aes

Name: An Introduction To Surfaces Analysis By Xps And Aes
Price: 86.5 EUR
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Author: John-F Watts
ISBN: 9780470847138

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John-F Watts - An Introduction To Surfaces Analysis By Xps And Aes.

An Introduction to Surface Analysis by XPS and AES is a clear and accessible introduction to the key electron spectroscopic techniques used in surface... Lire la suite

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An Introduction to Surface Analysis by XPS and AES is a clear and accessible introduction to the key electron spectroscopic techniques used in surface analysis. Starting with an introduction to the basic concepts of electron spectroscopy, the text moues on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complementary methods have been included to provide an up-to-date account of these widely used techniques.

- Electron Spectroscopy : Some Basic Concepts
- Electron Spectrometer Design
- The Electron Spectrum : Qualitative and Quantitaive Interpretation
- Compositional Depth Profiling
- Applications of Electron Spectroscopy in Materials Science
- Comparison of XPS and AES with Other Analytical Techniques.

Date de parution

01/04/2003
Editeur

Wiley
ISBN

0-470-84713-1
EAN

9780470847138
Présentation

Broché
Nb. de pages

212 pages
Poids

0.4 Kg
Dimensions

15,2 cm × 23,0 cm × 1,5 cm

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Biographie de John-F Watts

John F Watts is Professor of Adhesion Science in the School of Engineering at the University of Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis. John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.

An Introduction To Surfaces Analysis By Xps And Aes

John-F Watts

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