X-Rays and Extreme Ultraviolet Radiation. Principles and Applications
2nd edition

Par : David Attwood, Anne Sakdinawat
  • Nombre de pages634
  • FormatGrand Format
  • PrésentationRelié
  • Poids1.43 kg
  • Dimensions18,2 cm × 25,4 cm × 3,6 cm
  • ISBN978-1-107-06289-4
  • EAN9781107062894
  • Date de parution01/01/2016
  • ÉditeurCambridge University Press
  • IllustrateurLinda Geniesse

Résumé

With this fully updated second edition, you will gain a detailed understanding of the physics and applications of modern x-ray and extreme ultraviolet EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), x-ray and EUV optics, and nanoscale imaging, a completely revised chapter on spatial and temporal coherence, and extensive discussion of the generation and applications of femtosecond and attosecond techniques.
You will be guided step by step throug h the mathematics of each topic, with over 300 figures, 50 reference tables, and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online.

L'éditeur en parle

This is the "go-to" guide for graduate students, researchers, and industry practitioners looking to grasp the fundamentals of x-ray and EUV interaction with matter, or expand their knowledge of this rapidly growing field.
David ATTWOOD is Professor Emeritus at the University of California, Berkeley. He is a co-founder of the Applied Science and Technology PhD program at Berkeley, and a Fellow of the American Physical Society and the Optical Society of America. He has published over 100 scientific papers and co-edited several books. Anne SAKDINAWAT is a scientist at the SLAC National Accelerator Laboratory, where she leads a scientifically motivated imaging and nanofabrication group co-located at Stanford University.
She is the recipient of the international Meyer-Ilse Award for advances in x-ray microscopy, and a US Department of Energy Early Career Award.