Progress in transmission electron microscopy.. Volume 2, Applications in materials science

Par : Ze Zhang, Collectif, Xiao-Feng Zhang

Formats :

    • Nombre de pages300
    • PrésentationRelié
    • Poids0.605 kg
    • Dimensions16,0 cm × 24,0 cm × 1,7 cm
    • ISBN3-540-67681-3
    • EAN9783540676812
    • Date de parution08/11/2001
    • Collectionsurface sciences
    • ÉditeurSpringer

    Résumé

    Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
    Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.