An Introduction To Surfaces Analysis By Xps And Aes
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- Nombre de pages212
- PrésentationBroché
- Poids0.4 kg
- Dimensions15,2 cm × 23,0 cm × 1,5 cm
- ISBN0-470-84713-1
- EAN9780470847138
- Date de parution01/04/2003
- ÉditeurWiley
Résumé
An Introduction to Surface Analysis by XPS and AES is a clear and accessible introduction to the key electron spectroscopic techniques used in surface analysis. Starting with an introduction to the basic concepts of electron spectroscopy, the text moues on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complementary methods have been included to provide an up-to-date account of these widely used techniques.
An Introduction to Surface Analysis by XPS and AES is a clear and accessible introduction to the key electron spectroscopic techniques used in surface analysis. Starting with an introduction to the basic concepts of electron spectroscopy, the text moues on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complementary methods have been included to provide an up-to-date account of these widely used techniques.