JAYANTA DAS PURKAYASTHA

An in-depth preparation guide for PMP® and CAPM® exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using the Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on particular situations. Explanation of concepts through stepwise solved examples will provide readers with the hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.